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MENU
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Product Matrix
Single & Polycrystalline Diamond
Diamond–Cu/Al/SiC Composites
High-Conductivity Adhesive Thermal Gel
CCL/ AMB/DPC
Diamond Micro-Channel Cold Plates
Diamond-Based Wafers
Diamond Optical Products
APPLICATION
Chips
Optical Modules
Servers
Liquid-Cooled DCs
IGBT
Charging Piles
Robotics
Satellite Radar
NPO/CPO
TECHNICAL
Core Process
Inspection Standard
Quality Assurance
R&D TEAM
Li Zhengxin Team
Zheng Hui Team
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缺陷测试
2026-04-11 Views 565
缺陷测试：
X-Ray射线衍射检测
等技术 ，排查材料内部裂纹、孔隙等问题
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